Advanced Microwave Circuits and Systems by V. Zhurbenko

By V. Zhurbenko

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Hurst, S. H. Lewis, and R. G. Meyer, Analysis and Design of Analog Integrated Circuits, 5th edition, Wiley, 2009. , Ruttan, T. , and Polka, L. A. 37–43. , and Maurer, L. (2009). Extension of thru de-embedding technique for asymmetrical and differential devices, IET Circuits, Devices & Systems, vol. 3, no. 2, pp. 91–98. Ito, H. and Masu, K. (2008). A simple through-only de-embedding method for on-wafer Sparameter measurements up to 110 GHz, IEEE MTT-S International Microwave Symposium, pp. 383–386.

Bockelman, D. E. and Eisenstadt, W. R. (1995). Combined differential and common-mode scattering parameters: theory and simulation, IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 7, pp. 1530–1539. Daniel, E. , Harff, N. , Schreiber, S. , and Gilbert, B. K. (2004). Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure, 63rd ARFTG Conference, pp. 61–68. Faria, J. A. B. (2004). A new generalized modal analysis theory for nonuniform multiconductor transmission lines, IEEE Transactions on Power Systems, vol.

W1 and W2 diagonalize S21 S22 S12 S11 and −1 −1 S22 S12 S11 S21 , respectively, by similarity transformation: −1 −1 S22 S12 S11 W1 = Λ1 , W1−1 S21 (67) −1 −1 S11 S21 W2 = Λ2 , W2−1 S22 S12 (68) where Λ1 and Λ2 are diagonal matrices. W1 and W2 can be computed by eigenvalue decomposition. The derivation is similar to (Faria, 2004). S˜ is thus given by S˜ = WT1 S11 W1 W2−1 S21 W1 WT1 S12 (WT2 )−1 W2−1 S22 (WT2 )−1 . (69) 7. Multiport de-embedding using a THRU Suppose, as before, that the device under measurement and the THRU can be represented as shown in Fig.

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