Digital Logic Testing and Simulation, Second Edition by Alexander Miczo(auth.)

By Alexander Miczo(auth.)

Your highway map for assembly brand new electronic checking out challenges

this present day, electronic common sense units are universal in items that influence public protection, together with functions in transportation and human implants. exact checking out has develop into extra severe to reliability, safeguard, and the base line. but, as electronic structures turn into extra ubiquitous and intricate, the problem of checking out them has develop into tougher. As one improvement crew designing a RISC acknowledged, "the paintings required to . . . try out a chip of this measurement approached the volume of attempt required to layout it." A valued reference for almost twenty years, electronic good judgment trying out and Simulation has been considerably revised and up to date for designers and try out engineers who needs to meet this challenge.

there is not any unmarried option to the checking out challenge. prepared in an easy-to-follow, sequential structure, this moment version familiarizes the reader with the numerous diversified concepts for checking out and their purposes, and assesses the strengths and weaknesses of many of the techniques. The e-book reports the construction blocks of a profitable checking out method and publications the reader on deciding on the simplest resolution for a selected program. electronic good judgment checking out and Simulation, moment variation covers such key issues as:
* Binary determination Diagrams (BDDs) and cycle-based simulation
* Tester architectures/Standard attempt Interface Language (STIL)
* functional algorithms written in a layout Language (HDL)
* Fault tolerance
* Behavioral computerized try out development new release (ATPG)
* the improvement of the attempt layout professional (TDX), the various hindrances encountered and classes discovered in growing this novel checking out approach

updated and finished, electronic good judgment checking out and Simulation is a crucial source for someone charged with pinpointing defective items and assuring caliber, safeguard, and profitability.Content:
Chapter 1 advent (pages 1–32):
Chapter 2 Simulation (pages 33–117):
Chapter three Fault Simulation (pages 119–163):
Chapter four computerized try out development iteration (pages 165–231):
Chapter five Sequential common sense try out (pages 233–281):
Chapter 6 computerized attempt gear (pages 283–322):
Chapter 7 constructing a try out approach (pages 323–386):
Chapter eight Design?For?Testability (pages 387–450):
Chapter nine Built?In Self?Test (pages 451–512):
Chapter 10 reminiscence try (pages 513–550):
Chapter eleven IDDQ (pages 551–566):
Chapter 12 Behavioral attempt and Verification (pages 567–655):

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Extra resources for Digital Logic Testing and Simulation, Second Edition

Example text

14) In either situation, no defective units are shipped, regardless of which equation is used. For either of these equations, if the yield is known, it is possible to find the fault coverage required to achieve a desired defect level. Using Eq. 15) Example Integrated circuits (ICs) are manufactured on wafers—round, thin silicon substrates. After processing, individual ICs are tested. The wafer is diced and the die that tested bad are discarded. 1%, what level of testing must we achieve? Using Eq.

Unfortunately we are faced with the inescapable fact that testing adds cost to a product. 6. The solid line reflects quality level, in terms of defects per million (DPM) for a given process, assuming no test is performed. It is an inverse relationship; the higher the required quality, the fewer the number of die obtainable from the process. This follows from the simple fact that, for a given process, if higher quality (fewer DPM) is required, then feature sizes must be increased. The problem with this manufacturing model is that, if required quality level is too high, feature sizes may be so large that it is impossible to produce die competitively.

This may include RTL simulation using a hardware design language and/or simulation at a gate level with a logic simulator. Precise relationships must be satisfied between clock and data paths. After a logic board with many components is built, it is usually still possible to alter the timing of critical paths by inserting delays on the board. On an IC there is no recourse but to redesign the chip. This evaluation of timing can be accomplished by simulating input vectors with a timing simulator, or it can be done by tracing specific paths and summing up the delays of elements along the way.

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